A light reflection technique suitable for development into an automated surface quality certification system was investigated to determine if reflected light intensity distributions could be corre]ated with surface defect depths. Reflected laser light intensity distributions from pit and scratch defects on highly reflective spheres were studied with a commercial multi-element photodetector. It was found that the intensity distributions --Goll'lf be correlated with depths of pits and scratches in a size range of concern on highly reflective' spheres.