2 Matching Results
Results open in a new window/tab.
Results:
1 - 2 of
2
Fusion target analysis by quantitative scanning electron microscopy
Recent developments in computer based systems for quantitative x-ray microanalysis, 4 Pi surface examination, Auger electron spectroscopy and Backscattered Microtopography measurement have extended the Scanning Electron Microscope's applications in ICF target development and production.
Date:
September 25, 1979
Creator:
Ward, C.M.
Object Type:
Article
System:
The UNT Digital Library
Design of a positional reference system for ultraprecision machining
The primary goal for an ultraprecision turning machine is to have the capability to position precisely the cutting points of a tool along a defined contour with respect to the part. In order to accomplish this goal, the use of a stable-positional-reference system has become apparent. Several efforts have been made by representatives of the diamond-turning community to design such a needed reference system. Efforts made at Y-12 to design the needed system are reviewed.
Date:
September 25, 1979
Creator:
Arnold, J. B.; Burleson, R. R. & Pardue, R. M.
Object Type:
Report
System:
The UNT Digital Library