Low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry (open access)

Low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry

This article discusses low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry.
Date: June 8, 1998
Creator: McDaniel, Floyd Del. (Floyd Delbert), 1942-; Datar, Sameer A.; Guo, Baonian N.; Renfrow, Steve N.; Anthony, J. M. & Zhao, Z. Y.
System: The UNT Digital Library
Experimental evidence for a discrete transition to channeling for 1.0-MeV protons in Si〈100〉 (open access)

Experimental evidence for a discrete transition to channeling for 1.0-MeV protons in Si〈100〉

This article discusses experimental evidence for a discrete transition to channeling for 1.0-MeV protons in Si〈100〉.
Date: April 1998
Creator: Zhao, Z. Y.; Arrale, A. M.; Li, S. L.; Marble, D. K.; Weathers, Duncan L.; Matteson, Samuel E. et al.
System: The UNT Digital Library