Low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry (open access)

Low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry

This article discusses low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry.
Date: June 8, 1998
Creator: McDaniel, Floyd Del. (Floyd Delbert), 1942-; Datar, Sameer A.; Guo, Baonian N.; Renfrow, Steve N.; Anthony, J. M. & Zhao, Z. Y.
System: The UNT Digital Library
Charge-state dependence of K-shell x-ray production in aluminum by 2-12-MeV carbon ions (open access)

Charge-state dependence of K-shell x-ray production in aluminum by 2-12-MeV carbon ions

Article discussing research on the charge-state dependence of K-shell x-ray production in aluminum by 2-12-MeV carbon ions.
Date: June 1996
Creator: Sun, H. L.; Yu, Y. C.; Lin, E. K.; Wang, C. W.; Duggan, Jerome L.; Azordegan, A. R. et al.
System: The UNT Digital Library