Formation and characterization of ion beam assisted nanosystems in silicon (open access)

Formation and characterization of ion beam assisted nanosystems in silicon

Article on the formation and characterization of ion beam assisted nanosystems in silicon.
Date: August 2010
Creator: Poudel, Prakash R.; Rout, Bibhudutta; Hossain, K. M.; Dhoubhadel, Mangal; Kummari, Venkata C.; Neogi, Arup et al.
System: The UNT Digital Library
Strain fields around high-energy ion tracks in α-quartz (open access)

Strain fields around high-energy ion tracks in α-quartz

This article discusses strain fields around high-energy ion tracks in α-quartz.
Date: 2006
Creator: Follstaedt, David M.; Norman, A. K.; Doyle, B. L. & McDaniel, Floyd Del. (Floyd Delbert), 1942-
System: The UNT Digital Library
Experimental evidence for a discrete transition to channeling for 1.0-MeV protons in Si〈100〉 (open access)

Experimental evidence for a discrete transition to channeling for 1.0-MeV protons in Si〈100〉

This article discusses experimental evidence for a discrete transition to channeling for 1.0-MeV protons in Si〈100〉.
Date: April 1998
Creator: Zhao, Z. Y.; Arrale, A. M.; Li, S. L.; Marble, D. K.; Weathers, Duncan L.; Matteson, Samuel E. et al.
System: The UNT Digital Library
Z1 oscillations of the mean charge for isotachic ions in carbon foils (open access)

Z1 oscillations of the mean charge for isotachic ions in carbon foils

Article discussing Z1 oscillations of the mean charge for isotachic ions in carbon foils.
Date: April 1995
Creator: Arrale, A. M.; Jin, Jianyue; Zhao, Z. Y.; Weathers, Duncan L.; McDaniel, Floyd Del. (Floyd Delbert), 1942- & Matteson, Samuel E.
System: The UNT Digital Library
Charge-state dependence of M-shell x-ray production in 67Ho by 2-12-MeV carbon ions (open access)

Charge-state dependence of M-shell x-ray production in 67Ho by 2-12-MeV carbon ions

Article discussing research on the charge-state dependence of M-shell x-ray production in 67Ho by 2-12-MeV carbon ions.
Date: November 1995
Creator: Yu, Y. C.; Sun, H. L.; Duggan, Jerome L.; McDaniel, Floyd Del. (Floyd Delbert), 1942-; Yin, J. Y. & Lapicki, Gregory
System: The UNT Digital Library
Charge-state dependence of K-shell x-ray production in aluminum by 2-12-MeV carbon ions (open access)

Charge-state dependence of K-shell x-ray production in aluminum by 2-12-MeV carbon ions

Article discussing research on the charge-state dependence of K-shell x-ray production in aluminum by 2-12-MeV carbon ions.
Date: June 1996
Creator: Sun, H. L.; Yu, Y. C.; Lin, E. K.; Wang, C. W.; Duggan, Jerome L.; Azordegan, A. R. et al.
System: The UNT Digital Library
Fabrication of silicon-based optical components for an ultraclean accelerator mass spectronomy negative ion source (open access)

Fabrication of silicon-based optical components for an ultraclean accelerator mass spectronomy negative ion source

Article discussing the fabrication of silicon-based optical components for an ultraclean accelerator mass spectonomy negative ion source.
Date: May 1994
Creator: Kirchhoff, J. F.; Marble, D. K.; Weathers, Duncan L.; McDaniel, Floyd Del. (Floyd Delbert), 1942-; Matteson, Samuel E.; Anthony, J. M. et al.
System: The UNT Digital Library
High Sensitivity Measurement of Implanted as in the Presence of Ge in Ge(x)Si(1-x)/Si Layered Alloys Using Trace Element Accelerator Mass Spectrometry (open access)

High Sensitivity Measurement of Implanted as in the Presence of Ge in Ge(x)Si(1-x)/Si Layered Alloys Using Trace Element Accelerator Mass Spectrometry

This article discusses high sensitivity measurement of implanted As in the presence of Ge in Ge(x)Si(1-x)/Si layered alloys using trace element accelerator mass spectrometry.
Date: December 11, 2000
Creator: Datar, Sameer A.; Wu, Liying; Guo, Baonian N.; Nigam, Mohit; Necsoiu, Daniela; Zhai, Y. J. et al.
System: The UNT Digital Library
Low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry (open access)

Low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry

This article discusses low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry.
Date: June 8, 1998
Creator: McDaniel, Floyd Del. (Floyd Delbert), 1942-; Datar, Sameer A.; Guo, Baonian N.; Renfrow, Steve N.; Anthony, J. M. & Zhao, Z. Y.
System: The UNT Digital Library
Ion Beam Analyses of Carbon Nanotubes (open access)

Ion Beam Analyses of Carbon Nanotubes

This article discusses ion beam analyses of carbon nanotubes.
Date: January 7, 2005
Creator: Naab, Fabian U.; Holland, Orin W.; Duggan, Jerome L. & McDaniel, Floyd Del. (Floyd Delbert), 1942-
System: The UNT Digital Library
Simultaneous measurement of the average ion-induced electron emission yield and the mean charge for isotachic ions in carbon foils (open access)

Simultaneous measurement of the average ion-induced electron emission yield and the mean charge for isotachic ions in carbon foils

Article discussing the simultaneous measurement of the average ion-induced electron emission yield and the mean charge for isotachic ions in carbon foils.
Date: February 1997
Creator: Arrale, A. M.; Zhao, Z. Y.; Kirchhoff, J. F.; Weathers, Duncan L.; McDaniel, Floyd Del. (Floyd Delbert), 1942- & Matteson, Samuel E.
System: The UNT Digital Library