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Low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry
This article discusses low-level copper concentration measurements in silicon wafers using trace-element accelerator mass spectrometry.
Date:
June 8, 1998
Creator:
McDaniel, Floyd Del. (Floyd Delbert), 1942-; Datar, Sameer A.; Guo, Baonian N.; Renfrow, Steve N.; Anthony, J. M. & Zhao, Z. Y.
System:
The UNT Digital Library
Anomalous diffusion and ballistic peaks: A quantum perspective
Article discussing research on anomalous diffusion and ballistic peaks.
Date:
June 1998
Creator:
Stefancich, Marco; Allegrini, Paolo; Bonci, Luca; Grigolini, Paolo & West, Bruce J.
System:
The UNT Digital Library
Charge-state dependence of K-shell x-ray production in aluminum by 2-12-MeV carbon ions
Article discussing research on the charge-state dependence of K-shell x-ray production in aluminum by 2-12-MeV carbon ions.
Date:
June 1996
Creator:
Sun, H. L.; Yu, Y. C.; Lin, E. K.; Wang, C. W.; Duggan, Jerome L.; Azordegan, A. R. et al.
System:
The UNT Digital Library
Semiclassical chaos, the uncertainty principle, and quantum dissipation
Article on semiclassical chaos, the uncertainty principle, and quantum dissipation.
Date:
June 15, 1992
Creator:
Bonci, Luca; Roncaglia, Roberto; West, Bruce J. & Grigolini, Paolo
System:
The UNT Digital Library
Direct evidence for the amorphous silicon phase in visible photoluminescent porous silicon
Article on direct evidence for the amorphous silicon phase in visible photoluminescent porous silicon.
Date:
June 1, 1992
Creator:
Pérez, José M.; Villalobos, J.; McNeill, P.; Prasad, J.; Cheek, R.; Kelber, Jeffry A. et al.
System:
The UNT Digital Library