Measurements of dielectric leakage, capacitance, electric strength, andd charge scattering phenomena were performed at the Kukla and Godiva III critical assemblies for tantalum and aluminum electrolytic, wax- and oilimpregnated paper, mylar, mica, and ceramic capacitors, and for mylar and Vitamin B-impregnated paper. Leakage data indicate that gamma induced conductivity in capacitor dielectric varies directly with gamma DELTA , where gamma is the gamma radiation rate and DELTA is 0.9 for mylar, 0.7 for Vitamin Q-impregnated paper, and approximately 1.0 for the other dielectrics. A small portion of the tantalum oxide conductivity induced by gamma radiation exhibited a recovery time of approximately 150 mu s. Transient capacitance changes due to radiation were non- existent within plus or minus 0.1% for mica and Vitamin Q capacitors. Transient charging of tantalum capacitors was noted during irradiation with no applied voltage. No drastic changes in electric strength were noted during irradiation of mylar and Vitamin Q-impregnated paper. Results are compared with a summary of data previously collected by others. The use of test data in parametric form as a tool for predicting transient radiation effects is discussed. (auth)

This book is intended as a laboratory reference tool. The separate book chapters have been written by workers in the various fields covered, with a couple written by the contributing editor, Clement J. Rodden. The chapters were abstracted separately for the database.