Point-by-Point Compositional Analysis for Atom Probe Tomography (open access)

Point-by-Point Compositional Analysis for Atom Probe Tomography

This article demonstrates a new alternate approach to data processing for analyses that traditionally employed grid-based counting methods, as demonstrated using an atom-probe analysis of a Ni-based super-alloy.
Date: March 5, 2014
Creator: Stephenson, Leigh T.; Ceguerra, Anna V.; Li, Tong; Rojhirunsakool, Tanaporn; Nag, Soumya; Banerjee, Rajarshi et al.
System: The UNT Digital Library