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The Total Quality Approach to Transistor Testing and Device Allocation
The purpose of this study is to design a transistor conversion system oriented toward quality categories rather than toward devices. Underlying this purpose are two working hypotheses: First, quality categories can be developed by capitalizing on transistor total quality and convertibility; second, a transistor conversion system oriented toward quality categories is superior to existing device-oriented methods.
Date:
May 1971
Creator:
Novak, Jarry Vaclav
System:
The UNT Digital Library