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Frequency up-conversion in Lasing Without Inversion
This article suggests the possibility of frequency up-conversion in lasing without inversion.
Date:
December 11, 2014
Creator:
Davuluri, Sankar
System:
The UNT Digital Library
High Sensitivity Measurement of Implanted as in the Presence of Ge in Ge(x)Si(1-x)/Si Layered Alloys Using Trace Element Accelerator Mass Spectrometry
This article discusses high sensitivity measurement of implanted As in the presence of Ge in Ge(x)Si(1-x)/Si layered alloys using trace element accelerator mass spectrometry.
Date:
December 11, 2000
Creator:
Datar, Sameer A.; Wu, Liying; Guo, Baonian N.; Nigam, Mohit; Necsoiu, Daniela; Zhai, Y. J. et al.
System:
The UNT Digital Library