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Reflection from Si3N4
Photograph of a reflection from Si3N4 (silicon nitride) taken under a focused ion beam (FIB) microscope.
Date:
November 9, 2005
Creator:
University of North Texas. Center for Media Production.
System:
The UNT Digital Library
Surface
Photograph of a scan taken by a focused ion beam (FIB) microscope. The scan shows a large group of thin, elongated forms connected to an irregular surface.
Date:
November 9, 2005
Creator:
University of North Texas. Center for Media Production.
System:
The UNT Digital Library