This report summarizes the functional, model validation, and technology readiness testing of the Sandia MEMS Passive Shock Sensor in FY08. Functional testing of a large number of revision 4 parts showed robust and consistent performance. Model validation testing helped tune the models to match data well and identified several areas for future investigation related to high frequency sensitivity and thermal effects. Finally, technology readiness testing demonstrated the integrated elements of the sensor under realistic environments.

This report consists of two tables, preceded by a brief narrative. The first table summarizes the annual funding provisions, by program, in (1) current law, (2) H.R. 2419 as passed, and (3) the Bush Administration's farm bill proposals. The second table compares FY2007 authorized and actual funding levels for programs authorized in the 2002 farm bill with FY2008 and FY2012 funding levels that would be authorized in the 2007 House-passed farm bill.

This report consists of two tables, preceded by a brief narrative. The first table summarizes the annual funding provisions, by program, in (1) current law, (2) H.R. 2419 as passed, and (3) the Bush Administration's farm bill proposals. The second table compares FY2007 authorized and actual funding levels for programs authorized in the 2002 farm bill with FY2008 and FY2012 funding levels that would be authorized in the 2007 House-passed farm bill.

Progress in MEMS fabrication has enabled a wide variety of force and displacement sensing devices to be constructed. One device under intense development at Sandia is a passive shock switch, described elsewhere (Mitchell 2008). A goal of all MEMS devices, including the shock switch, is to achieve a high degree of reliability. This, in turn, requires systematic methods for validating device performance during each iteration of design. Once a design is finalized, suitable tools are needed to provide quality assurance for manufactured devices. To ensure device performance, measurements on these devices must be traceable to NIST standards. In addition, accurate metrology of MEMS components is needed to validate mechanical models that are used to design devices to accelerate development and meet emerging needs. Progress towards a NIST-traceable calibration method is described for a next-generation, 2D Interfacial Force Microscope (IFM) for applications in MEMS metrology and qualification. Discussed are the results of screening several suitable calibration methods and the known sources of uncertainty in each method.

Annual report detailing the effectiveness of Texas risk management during fiscal year 2008 including cost containment measures measures to reduce workers' compensation payments.