A description is given of the analytic and numerical work, performed from July 1955 through August 1956, so as to develop, and then study, the process of making intense proton beams, suitable for colliding beams. It is shown how this investigation led, in a most natural way, to the realization that stochasticity can arise in a simple Hamiltonian system. Furthermore, the criterion for the onset of stochasticity was understood, and carefully studied, in two different situations. The first situation was the proposed (and subsequently used) ''stacking process'' for developing an intense beam, where stochasticity occurs as additional particles are added to the intense circulating beam. The second situation occurs when one seeks to develop ''stochastic accelerators'' in which particles are accelerated (continuously) by a collection of radio frequency systems. It was in the last connection that the well-known criterion for stochasticity, resonance overlap, was obtained.

A beam splitter to create two separated parallel beams is a critical unit of a pencil beam interferometer, for example the long trace profiler (LTP). The operating principle of the beam splitter can be based upon either amplitude-splitting (AS) or wavefront-splitting (WS). For precision measurements with the LTP, an equal optical path system with two parallel beams is desired. Frequency drift of the light source in a non-equal optical path system will cause the interference fringes to drift. An equal optical path prism beam splitter with an amplitude-splitting (AS-EBS) beam splitter and a phase shift beam splitter with a wavefront-splitting (WS-PSBS) are introduced. These beam splitters are well suited to the stability requirement for a pencil beam interferometer due to the characteristics of monolithic structure and equal optical path. Several techniques to produce WS-PSBS by hand are presented. In addition, the WS-PSBS using double thin plates, made from microscope cover plates, has great advantages of economy, convenience, availability and ease of adjustment over other beam splitting methods. Comparison of stability measurements made with the AS-EBS, WS-PSBS, and other beam splitters is presented.

Fast neutrons can be detected with relatively high efficiency, >15%, using two planes of hydrogenous scintillator detectors where a scatter in the first plane creates a start pulse and scatter in the second plane is separated by time-of-flight. Indeed, the neutron spectrum of the source can be determined as the sum of energy deposited by pulse height in the first added to the energy of the second found by time-of-flight to the second detector. Gamma rays can also create a double scatter by Compton interaction in the first with detection in the second, but these events occur in a single time window because the scattered photons all travel at the speed of light. Thus, gamma ray events can be separated from neutrons by the time-of-flight differences. We have studied this detection system with a Cf-252 source using Bicron 501A organic scintillators and report on the ability to efficiently detect fast neutrons with high neutron/gamma detection ratios. We have further studied cosmic-ray neutron background detection response that is the dominant background in long range detection. We have found that most of the neutrons are excluded from the time-of-flight window because they are either too high in energy, >10 keV, or too …

A new thermal neutron imaging system has been constructed, based on a 20-cm x 17-cm He-3 position-sensitive detector with spatial resolution better than 1 mm. New compact custom-designed position-decoding electronics are employed, as well as high-precision cadmium masks with Modified Uniformly Redundant Array patterns. Fast Fourier Transform algorithms are incorporated into the deconvolution software to provide rapid conversion of shadowgrams into real images. The system demonstrates the principles for locating sources of thermal neutrons by a stand-off technique, as well as visualizing the shapes of nearby sources. The data acquisition time could potentially be reduced two orders of magnitude by building larger detectors.

Understanding magnetic structures and properties of patterned and ordinary magnetic films at nanometer length-scale is the area of immense technological and fundamental scientific importance. The key feature to such success is the ability to achieve visual quantitative information on domain configurations with a maximum ''magnetic'' resolution. Several methods have been developed to meet these demands (Kerr and Faraday effects, differential phase contrast microscopy, magnetic force microscopy, SEMPA etc.). In particular, the modern off-axis electron holography allows retrieval of the electron-wave phase shifts down to 2{pi}/N (with typical N = 10-20, approaching in the limit N {approx} 100) in TEM equipped with field emission gun, which is already successfully employed for studies of magnetic materials at nanometer scale. However, it remains technically demanding, sensitive to noise and needs highly coherent electron sources. As possible alternative we developed a new method of Lorentz phase microscopy [1,2] based on the Fourier solution [3] of magnetic transport-of-intensity (MTIE) equation. This approach has certain advantages, since it is less sensitive to noise and does not need high coherence of the source required by the holography. In addition, it can be realized in any TEM without basic hardware changes. Our approach considers the electron-wave refraction in …

Understanding the structure and magnetic behavior is crucial for optimization of nanocomposite magnets with high magnetic energy products. Many contributing factors such as phase composition, grain size distribution and specific domain configurations reflect a fine balance of magnetic energies at nanometer scale. For instance, magnetocrystalline anisotropy of grains and their orientations, degree of exchange coupling of magnetically soft and hard phases and specific energy of domain walls in a material. Modern microscopy, including Lorentz microscopy, is powerful tool for visualization and microstructure studies of nanocomposite magnets. However, direct interpretation of magnetically sensitive Fresnel/Foucault images for nanomagnets is usually problematic, if not impossible, because of the complex image contrast due to small grain size and sophisticated domain structure. Recently we developed an imaging technique based on Lorentz phase microscopy [l-4], which allows bypassing many of these problems and get quantitative information through magnetic flux mapping at nanometer scale resolution with a magnetically calibrated TEM [5]. This is our first report on application of this technique to nanocomposite magnets. In the present study we examine a nanocomposite magnet of nominal composition Nd{sub 2}Fe{sub 14+{delta}}B{sub 1.45} (14+{delta}=23.3, i.e. ''hard'' Nd{sub 2}Fe{sub 14}B-phase and 47.8 wt% of ''soft'' {alpha}-Fe phase ({delta}=9.3)), produced by Magnequench …

Off-line conditioning of full-size optics for the National Ignition Facility required a beam delivery system to allow conditioning lasers to rapidly raster scan samples while achieving several technical goals. The main purpose of the optical system designed was to reconstruct at the sample plane the flat beam profile found at the laser aperture with significant reductions in beam wander to improve scan times. Another design goal was the ability to vary the beam size at the sample to scan at different fluences while utilizing all of the laser power and minimizing processing time. An optical solution was developed using commercial off-the-shelf lenses. The system incorporates a six meter relay telescope and two sets of focusing optics. The spacing of the focusing optics is changed to allow the fluence on the sample to vary from 2 to 14 Joules per square centimeter in discrete steps. More importantly, these optics use the special properties of image relaying to image the aperture plane onto the sample to form a pupil relay with a beam profile corresponding almost exactly to the flat profile found at the aperture. A flat beam profile speeds scanning by providing a uniform intensity across a larger area on the …