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Why Color-Flavor Locking Is Just Like Chiral Symmetry Breaking (open access)

Why Color-Flavor Locking Is Just Like Chiral Symmetry Breaking

The authors review how a classification into representations of color and flavor can be used to understand the possible patterns of symmetry breaking for color superconductivity in dense quark matter. In particular, the authors show how for three flavors, color-flavor locking is precisely analogous to the usual pattern of chiral symmetry breaking in the QCD vacuum.
Date: May 10, 2000
Creator: Pisarski, R. D. & Rischke, D. H.
System: The UNT Digital Library
Composition and structure of sputter deposited erbium hydride thin films (open access)

Composition and structure of sputter deposited erbium hydride thin films

Erbium hydride thin films are grown onto polished, a-axis {alpha} Al{sub 2}O{sub 3} (sapphire) substrates by reactive ion beam sputtering and analyzed to determine composition, phase and microstructure. Erbium is sputtered while maintaining a H{sub 2} partial pressure of 1.4 x 10{sup {minus}4} Torr. Growth is conducted at several substrate temperatures between 30 and 500 C. Rutherford backscattering spectrometry (RBS) and elastic recoil detection analyses after deposition show that the H/Er areal density ratio is approximately 3:1 for growth temperatures of 30, 150 and 275 C, while for growth above {approximately}430 C, the ratio of hydrogen to metal is closer to 2:1. However, x-ray diffraction shows that all films have a cubic metal sublattice structure corresponding to that of ErH{sub 2}. RBS and Auger electron that sputtered erbium hydride thin films are relatively free of impurities.
Date: May 10, 2000
Creator: Adams, David P.; Romero, Juan A.; Rodriguez, Mark A.; Floro, Jerrold A. & Banks, James C.
System: The UNT Digital Library
Direct simulation of particle-laden fluids (open access)

Direct simulation of particle-laden fluids

Processes that involve particle-laden fluids are common in geomechanics and especially in the petroleum industry. Understanding the physics of these processes and the ability to predict their behavior requires the development of coupled fluid-flow and particle-motion computational methods. This paper outlines an accurate and robust coupled computational scheme using the lattice-Boltzmann method for fluid flow and the discrete-element method for solid particle motion. Results from several two-dimensional validation simulations are presented. Simulations reported include the sedimentation of an ellipse, a disc and two interacting discs in a closed column of fluid. The recently discovered phenomenon of drafting, kissing, and tumbling is fully reproduced in the two-disc simulation.
Date: May 10, 2000
Creator: Cook, Benjamin K.; Noble, David R.; Preece, Dale S. & Williams, J. R.
System: The UNT Digital Library
Critical currents and weak links in melt textured R123 (open access)

Critical currents and weak links in melt textured R123

Weak link behavior is studied, using magnetization and Hall probe measurements of ring samples, in welded melt-textured R123 monoliths and in dual-seeded samples with disoriented domains. Techniques for welding samples yield transport currents across the junction that are in excess of 10{sup 4} A/cm{sup 2}.
Date: May 10, 2000
Creator: Veal, B. W.; Zhang, H.; Claus, H.; Chen, L.; Paulikas, A. P.; Koshelev, A. et al.
System: The UNT Digital Library
Twinning microstructure and charge ordering in the colossal magnetoresistive manganite Nd{sub 1/2}Sr{sub 1/2}MnO{sub 3} (open access)

Twinning microstructure and charge ordering in the colossal magnetoresistive manganite Nd{sub 1/2}Sr{sub 1/2}MnO{sub 3}

Charge ordering (C.O.) in the colossal magnetoresistive (CMR) manganites gives rise to an insulating, high-resistance state. This charge ordered state can be melted into a low-resistance metallic-like state by the application of magnetic field. Thus, the potential to attain high values of magnetoresistance with the application of small magnetic fields may be aided by a better understanding of the charge-ordering phenomenon. This study focused on microstructural characterization in Nd{sub 1/2}Sr{sub 1/2}MnO{sub 3}. In Nd{sub 1/2}Sr{sub 1/2}MnO{sub 3}, the nominal valence of Mn is 3.5+. On cooling, charge can localize and lead to a charge ordering between Mn 3+ and Mn 4+. The ordering of charge results in a superlattice structure and a reduction in symmetry. Thin foil specimens were prepared from bulk samples by conventional thinning and ion milling (at LiqN{sub 2} temperature) methods. The room temperature TEM observation of Nd{sub 1/2}Sr{sub 1/2}MnO{sub 3} reveals that it contains a highly twinned microstructure, together with a small number of stacking faults (SFS). A figure shows the same area of the specimen at different zone axes obtained by tilting around two perpendicular directions as indicated. Three grains A, B and C are labeled for each of the zone axes. The room temperature …
Date: May 10, 2000
Creator: Luo, Z. P.; Miller, D. J. & Mitchell, J. F.
System: The UNT Digital Library
Experience with copper oxide production in antiproton source components at Fermi National Accelerator Laboratory (open access)

Experience with copper oxide production in antiproton source components at Fermi National Accelerator Laboratory

The Antiproton (Pbar) Source at Fermi National Accelerator Laboratory is a facility comprised of a target station, two rings called the Debuncher and Accumulator and the transport lines between those rings and the remainder of the particle accelerator complex. Water is by far the most common medium for carrying excess heat away from components, primarily electromagnets, in this facility. The largest of the water systems found in Pbar is the 95 degree Fahrenheit Low Conductivity Water (LCW) system. LCW is water which has had free ions removed, increasing its resistance to electrical current. This water circuit is used to cool magnets, power supplies, and stochastic cooling components and typically has a resistivity of 11--18 megaohms-cm. For more than ten years the Antiproton rings were plagued with overheating magnets due to plugged water-cooling channels. Various repairs have been tried over the years with no permanent success. Throughout all of this time, water samples have indicated copper oxide, CuO, as the source of the contamination. Matters came to a head in early 1997 following a major underground LCW leak between the Central Utilities Building and the Antiproton Rings enclosures. Over a span of several weeks following system turn-on, some twenty magnets overheated …
Date: May 10, 2000
Creator: Ader, Christine R.; Jr., Elvin R. Harms & Morgan, and James P.
System: The UNT Digital Library
Modeling and Mitigation of Stress Corrosion Cracking in Closure Welds of High-Level Waste Container for Yucca Mountain (open access)

Modeling and Mitigation of Stress Corrosion Cracking in Closure Welds of High-Level Waste Container for Yucca Mountain

None
Date: May 10, 2000
Creator: Farmer, J.; Lu, S.; Summers, T.; McCright, D.; Lingenfelter, A.; Wang, F. et al.
System: The UNT Digital Library
Focused ion beam damage to MOS integrated circuits (open access)

Focused ion beam damage to MOS integrated circuits

Commercial focused ion beam (FIB) systems are commonly used to image integrated circuits (ICS) after device processing, especially in failure analysis applications. FIB systems are also often employed to repair faults in metal lines for otherwise functioning ICS, and are being evaluated for applications in film deposition and nanofabrication. A problem that is often seen in FIB imaging and repair is that ICS can be damaged during the exposure process. This can result in degraded response or out-right circuit failure. Because FIB processes typically require the surface of an IC to be exposed to an intense beam of 30--50 keV Ga{sup +} ions, both charging and secondary radiation damage are potential concerns. In previous studies, both types of effects have been suggested as possible causes of device degradation, depending on the type of device examined and/or the bias conditions. Understanding the causes of this damage is important for ICS that are imaged or repaired by a FIB between manufacture and operation, since the performance and reliability of a given IC is otherwise at risk in subsequent system application. In this summary, the authors discuss the relative roles of radiation damage and charging effects during FIB imaging. Data from exposures of …
Date: May 10, 2000
Creator: Fleetwood, D. M.; Campbell, Ann N.; Hembree, Charles E.; Tangyunyong, Paiboon; Jessing, Jeffrey R. & Soden, Jerry M.
System: The UNT Digital Library