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Single event upset tests of a RISC-based fault-tolerant computer
The project successfully demonstrated that dual lock-step comparison of commercial RISC processors is a viable fault-tolerant approach to handling SEU in space environment. The fault tolerant approach on orbit error rate was 38 times less than the single processor error rate. The random nature of the upsets and appearance in critical code section show it is essential to incorporate both hardware and software in the design and operation of fault-tolerant computers.
Date:
March 23, 1996
Creator:
Kimbrough, J.R.; Butner, D.N.; Colella, N.J.; Kaschmitter, J.L.; Shaeffer, D.L.; McKnett, C.L. et al.
System:
The UNT Digital Library