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Ion Beam Analysis of Microcrystalline Quartz Artifacts from the Reed Mound Site, Delaware County, Oklahoma
This paper from the 23rd Conference on Application of Accelerators in Research and Industry conference proceedings evaluates the potential of particle induced X-ray emission spectrometry as a tool for future Ozarks chert provenance studies based on its ability to facilitate discrimination of Ozarks chert materials from different geological formations and identification of discrete groups of artifacts from the same geological formation.
Date:
June 18, 2015
Creator:
Younger-Mertz, S. B.; Manuel, J. E.; Reinert, Tilo; Szilasi, S. Z.; Hammerstedt, S. W. & Glass, Gary A.
Object Type:
Article
System:
The UNT Digital Library
Direct Graphene Growth on Metal Oxides by Molecular Epitaxy
Patent relating to the controlled, layer-by-layer growth of graphene on a useful, magnetizable/and or insulating substrate using molecular beam epitaxy (MBE).
Date:
June 13, 2013
Creator:
Kelber, Jeffry A.
Object Type:
Patent
System:
The UNT Digital Library
Controlled Depositions of Metal and Metal Cluster Ions by Surface Field Patterning in Soft-Landing Devices
Patent relating to controlled deposition of metal and metal cluster ions by surface field patterning in soft-landing devices.
Date:
April 19, 2011
Creator:
Verbeck, Guido F. & Davila, Stephen
Object Type:
Patent
System:
The UNT Digital Library