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Transistorized Trip Circuit for Critical Assemblies
Abstract: A transistor trip circuit intended for critical assemblies and which provides maximum safety against human error or component failure is described.
Date:
February 24, 1958
Creator:
Wade, E. J. & Davidson, D. S.
System:
The UNT Digital Library
Engineering Test Reactor Critical Facility Hazards Summary Report, Supplement I
Report that "is a supplement to IDO-16332, "The Engineering Test Reactor Critical Facility Hazards Summary Report", presenting information on the conduct in the Facility of certain experiments which are expected to be operated in the Engineering Test Reactor" (p. 3).
Date:
January 24, 1958
Creator:
deBoisblanc, D. R.; Burdick, Earl E. & DeBoer, T. K.
System:
The UNT Digital Library