A study of metallurgical problems resulting from variation in grain boundaries, bonding layers, and inclusions in metals and alloys has become increasingly important over the past several years. To keep pace with and aid in these studies, several new techniques have been developed in emission and X-ray spectroscopy. In X-ray, areas as smalls as one square micron can be studied by making them targets for a focused electron beam and observing the X-rays emitted (5,2). Such an instrument would be quite helpful at Hanford, but the high original cost is prohibitive.