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Development of a new generation of optical slope measuring profiler
A collaboration, including all DOE synchrotron labs, industrial vendors of x-ray optics, and with active participation of the HBZ-BESSY-II optics group has been established to work together on a new slope measuring profiler -- the optical slope measuring system (OSMS). The slope measurement accuracy of the instrument is expected to be<50 nrad for the current and future metrology of x-ray optics for the next generation of light sources. The goals were to solidify a design that meets the needs of mirror specifications and also be affordable; and to create a common specification for fabrication of a multi-functional translation/scanning (MFTS) system for the OSMS. This was accomplished by two collaborative meetings at the ALS (March 26, 2010) and at the APS (May 6, 2010).
Date:
September 16, 2010
Creator:
Yashchuk, Valeriy V.; Takacs, Peter Z.; McKinney, Wayne R.; Assoufid, Lahsen; Siewert, Frank & Zeschke, Thomas
System:
The UNT Digital Library
First-Principles-Based Kinetic Monte Carlo Simulation of Nitric Oxide Reduction over Platinum Nanoparticles under Lean-Burn Conditions
This article discusses first-principles-based kinetic Monte Carlo simulation of Nitric Oxide reduction.
Date:
September 16, 2010
Creator:
Mei, Donghai; Du, Jincheng & Neurock, Matthew
System:
The UNT Digital Library
Comparison of Leading Parallel NAS File Systems on Commodity Hardware
None
Date:
September 16, 2010
Creator:
Fitzgerald, K; Gary, M; Hedges, R M & Stearman, D M
System:
The UNT Digital Library
Accountable Science: The COMPETES Act Needs to Demonstrate an Accountability Attitude
Article on the U.S. National Science Foundation's (NSF) Broader Impacts Merit Review Criterion in relation to the America COMPETES Reauthorization Act of 2010.
Date:
September 16, 2010
Creator:
Holbrook, J. Britt
System:
The UNT Digital Library