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Ready, set, go . . . well maybe (open access)

Ready, set, go . . . well maybe

The agenda for this presentation is: (1) understand organizational readiness for changes; (2) review benefits and challenges of change; (3) share case studies of ergonomic programs that were 'not ready' and some that were 'ready'; and (4) provide some ideas for facilitating change.
Date: February 28, 2011
Creator: Alexandre, Melanie M & Bartolome, Terri-Lynn C
System: The UNT Digital Library
Effects On Beam Alignment Due To Neutron-Irradiated CCD Images At The National Ignition Facility (open access)

Effects On Beam Alignment Due To Neutron-Irradiated CCD Images At The National Ignition Facility

The 192 laser beams in the National Ignition Facility (NIF) are automatically aligned to the target-chamber center using images obtained through charged coupled device (CCD) cameras. Several of these cameras are in and around the target chamber during an experiment. Current experiments for the National Ignition Campaign are attempting to achieve nuclear fusion. Neutron yields from these high energy fusion shots expose the alignment cameras to neutron radiation. The present work explores modeling and predicting laser alignment performance degradation due to neutron radiation effects, and demonstrates techniques to mitigate performance degradation. Camera performance models have been created based on the measured camera noise from the cumulative single-shot fluence at the camera location. We have found that the effect of the neutron-generated noise for all shots to date have been well within the alignment tolerance of half a pixel, and image processing techniques can be utilized to reduce the effect even further on the beam alignment.
Date: February 28, 2011
Creator: Awwal, A.; Manuel, A.; Datte, P. & Burkhart, S.
System: The UNT Digital Library
Critical challenges for EUV resist materials (open access)

Critical challenges for EUV resist materials

Although Extreme ultraviolet lithography (EUVL) is now well into the commercialization phase, critical challenges remain in the development of EUV resist materials. The major issue for the 22-nm half-pitch node remains simultaneously meeting resolution, line-edge roughness (LER), and sensitivity requirements. Although several materials have met the resolution requirements, LER and sensitivity remain a challenge. As we move beyond the 22-nm node, however, even resolution remains a significant challenge. Chemically amplified resists have yet to demonstrate the required resolution at any speed or LER for 16-nm half pitch and below. Going to non-chemically amplified resists, however, 16-nm resolution has been achieved with a LER of 2 nm but a sensitivity of only 70 mJ/cm{sup 2}.
Date: February 28, 2011
Creator: Naulleau, Patrick P.; Anderson, Christopher N.; Baclea-an, Lorie-Mae; Denham, Paul; George, Simi; Goldberg, Kenneth A. et al.
System: The UNT Digital Library
Results from a Prototype Chicane-Based Energy Spectrometer for a Linear Collider (open access)

Results from a Prototype Chicane-Based Energy Spectrometer for a Linear Collider

The International Linear Collider (ILC) and other proposed high energy e{sup +}e{sup -} machines aim to measure with unprecedented precision Standard Model quantities and new, not yet discovered phenomena. One of the main requirements for achieving this goal is a measurement of the incident beam energy with an uncertainty close to 10{sup -4}. This article presents the analysis of data from a prototype energy spectrometer commissioned in 2006-2007 in SLAC's End Station A beamline. The prototype was a 4-magnet chicane equipped with beam position monitors measuring small changes of the beam orbit through the chicane at different beam energies. A single bunch energy resolution close to 5 {center_dot} 10{sup -4} was measured, which is satisfactory for most scenarios. We also report on the operational experience with the chicane-based spectrometer and suggest ways of improving its performance.
Date: February 28, 2011
Creator: Lyapin, A.; Schreiber, H. J.; Viti, M.; Adolphsen, C.; Arnold, R.; Boogert, S. et al.
System: The UNT Digital Library