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Texture Development During Equal Channel Angular Forging of BCC Metals (open access)

Texture Development During Equal Channel Angular Forging of BCC Metals

Equal channel angular forging (ECAF) has been proposed as a severe plastic deformation technique for processing metals, alloys, and composites [e.g. Segal, 1995] (Fig. 1). The technique offers two capabilities of practical interest: a high degree of strain can be introduced with no change in the cross-sectional dimensions of the work-piece, hence, even greater strains can be introduced by re-inserting the work-piece for further deformation during subsequent passes through the ECAF die. Additionally, the deformation is accomplished by simple shear (like torsion of a short tube) on a plane whose orientation, with respect to prior deformations, can be controlled by varying the processing route. There is a nomenclature that has developed in the literature for the typical processing routes: A: no rotations; B{sub A}: 90 degrees CW (clockwise), 90 degrees CCW (counterclockwise), 9O degrees CW, 90 degrees CCW...; Bc: 90 degrees CW, 90 degrees CW, 90 degrees CW...; and C: 180 degrees, 18 0 degrees.... The impact of processing route on the subsequent microstructure [Ferasse, Segal, Hartwig and Goforth, 1997; Iwahashi, Horita, Nemoto and Langdon, 1996] and texture [Gibbs, Hartwig, Cornwell, Goforth and Payzant, 1998] has been the subject of numerous experimental studies.
Date: August 8, 1999
Creator: Agnew, S. R.
System: The UNT Digital Library
Coulomb Repulsion in Miniature Ion Mobility Spectrometry (open access)

Coulomb Repulsion in Miniature Ion Mobility Spectrometry

We have undertaken a study of ion mobility resolution in a miniature ion mobility spectrometer with a drift channel 1.7 mm in diameter and 35 mm in length. The device attained a maximum resolution of 14 in separating ions of NO, O{sub 2}, and methyl iodine. The ions were generated by pulses from a frequency-quadrupled Nd:YAG laser. Broadening due to Coulomb repulsion was modeled theoretically and shown experimentally to have a major effect on the resolution of the miniature device.
Date: August 8, 1999
Creator: Xu, J.; Whitten, W. B. & Ramsey, J. M.
System: The UNT Digital Library