Self-scanning photodiode arrays were tested for their ability to measure the spatial distribution of low-energy x rays in a wavelength-dispersive spectrometer. X-ray spectral sensitivity was measured with a calibrated dc source of nearly-monochromatic characteristic-x rays with photon energies in the range of 1.5 to 8 keV. Photodiode response was found to be linear with x-ray flux. Exposure to large doses of copper radiation did not affect sensitivity. A mathematical model that describes the experimental data is presented. It was found that spatial resolving power was lowered by the dispersal of photogenerated charges. This effect was investigated with collimated beams and is described with a formula that predicts the loss of diode signals. (auth)