Debuncher Profile Monitor Evaluation (open access)

Debuncher Profile Monitor Evaluation

The original microchannel plates have been damaged in the beam region. After an attempt to revive the plates by baking, the gain of the central 30mm is still reduced by approximately a factor of three. The plates appear to have been irreversibly damaged by being operated for an extended period of time at high gain with high debuncher beam currents. A new set of microchannel plates has been installed in the monitor. Because of a production error, the gap between the microchannel plate output and the anode wire plane was set at 15mm instead of 3mm. The high voltage divider allowed a maximum of 170 volts to be applied across this gap. Under the conditions at which the Monitor was being operated, the distribution of collected electrons from a single micro channel was spread over a large area. A collimated UV light source which had a FWHM of 3mm produced a profile with a FWHM of 22mm with an amplifier threshold supply voltage of 1.0 V and FWHM of 9mm with a threshold voltage of 5.0V. See Figure 1. When new microchannel plates were installed, the anode gap was reduced to 9.5mm, and the gap voltage was increased to 760V, …
Date: January 13, 1986
Creator: Krider, J.
System: The UNT Digital Library