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Flat Field Anomalies in an X-ray CCD Camera Measured Using a Manson X-ray Source (HTPD 08 paper) (open access)

Flat Field Anomalies in an X-ray CCD Camera Measured Using a Manson X-ray Source (HTPD 08 paper)

The Static X-ray Imager (SXI) is a diagnostic used at the National Ignition Facility (NIF) to measure the position of the X-rays produced by lasers hitting a gold foil target. The intensity distribution taken by the SXI camera during a NIF shot is used to determine how accurately NIF can aim laser beams. This is critical to proper NIF operation. Imagers are located at the top and the bottom of the NIF target chamber. The CCD chip is an X-ray sensitive silicon sensor, with a large format array (2k x 2k), 24 {micro}m square pixels, and 15 {micro}m thick. A multi-anode Manson X-ray source, operating up to 10kV and 10W, was used to characterize and calibrate the imagers. The output beam is heavily filtered to narrow the spectral beam width, giving a typical resolution E/{Delta}E {approx} 10. The X-ray beam intensity was measured using an absolute photodiode that has accuracy better than 1% up to the Si K edge and better than 5% at higher energies. The X-ray beam provides full CCD illumination and is flat, within {+-}1% maximum to minimum. The spectral efficiency was measured at 10 energy bands ranging from 930 eV to 8470 eV. We observed an …
Date: April 28, 2008
Creator: Haugh, M & Schneider, M B
System: The UNT Digital Library