Thin film multilayers have previously been introduced on multilayer low temperature cofired ceramic (LTCC), as well as initial thin film capacitors on LTCC. The ruggedness of a multipurpose Ti-Cu-Pt-Au stack for connectivity and RF conductivity has continued to benefit fabrication and reliability in state of-the-art modules, while the capacitors have followed the traditional Metal-Insulator-Metal (MIM) style. The full integration of thin film passives with thin film connectivity traces is presented. Certain passives, such as capacitors, require specifically tailored and separately patterned thin film (multi-)layers, including a dielectric. Different capacitance values are achieved by variation of both the insulator layer thickness and the active area of the capacitor. Other passives, such as filters, require only the conductor - a single thin film multilayer. This can be patterned from the same connectivity thin film material (Ti-Cu-Pt-Au), or a specially tailored thin film material (e.g. Ti-Cu-Au) can be deposited. Both versions are described, including process and integration details. Examples are discussed, ranging from patterning for maximum tolerances, to space and performance-optimized designs. Cross-sectional issues associated with integration are also highlighted in the discussion.

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In this study, the authors applied the state-of-the art sensitivity methods to downselect system parameters from 4000+ to 8, (23000+ -> 4000+ -> 84 -> 8). This analysis procedure paves the way for future works: (1) calibrate the system response using existed experimental observations, and (2) predict future experiment results, using the calibrated system.

Volume x-ray gratings consisting of a multilayer coating deposited on a blazed substrate can diffract with very high efficiency even in high orders if diffraction conditions in-plane (grating) and out-of-plane (Bragg multilayer) are met simultaneously. This remarkable property however depends critically on the ability to create a structure with near atomic perfection. In this work we report on a method to produce these structures. We report measurements that show, for a 5000 l/mm grating diffracting in the 3rd order, a diffraction efficiency of 37.6percent at a wavelength of 13.6 nm, close to the theoretical maximum. This work now shows a direct route to achieving high diffraction efficiency in high order at wavelengths throughout the soft x-ray energy range.

A general approach for ab initio calculations of electronic continuum processes is described in which the many-electron wave function is expanded using a combination of orbitals at short range and the finite-element discrete variable representation(FEM-DVR) at larger distances. The orbital portion of the basis allows the efficient construction of many-electron configurations in which some of the electrons are bound, but because the orbitals are constructed from an underlying FEM-DVR grid, the calculation of two-electron integrals retains the efficiency of the primitive FEM-DVR approach. As an example, double photoionization of beryllium is treated in a calculation in which the 1s{sup 2} core is frozen. This approach extends the use of exterior complex scaling (ECS) successfully applied to helium and H{sub 2} to calculations with two active electrons on more complicated targets. Integrated, energy-differential and triply-differential cross sections are exhibited, and the results agree well with other theoretical investigations.

Implicit Monte Carlo (IMC) and Implicit Monte Carlo Diffusion (IMD) are approaches to the numerical solution of the equations of radiative transfer. IMD was previously derived and numerically tested on grey, or frequency-integrated problems. In this research, we extend Implicit Monte Carlo Diffusion (IMD) to account for frequency dependence, and we implement the difference formulation as a source manipulation variance reduction technique. We derive the relevant probability distributions and present the frequency dependent IMD algorithm, with and without the difference formulation. The IMD code with and without the difference formulation was tested using both grey and frequency dependent benchmark problems. The Su and Olson semi-analytic Marshak wave benchmark was used to demonstrate the validity of the code for grey problems. The Su and Olson semi-analytic picket fence benchmark was used for the frequency dependent problems. The frequency dependent IMD algorithm reproduces the results of both Su and Olson benchmark problems. Frequency group refinement studies indicate that the computational cost of refining the group structure is likely less than that of group refinement in deterministic solutions of the radiation diffusion methods. Our results show that applying the difference formulation to the IMD algorithm can result in an overall increase in the …

A new Dual Channel Highly Ordered Pyrolytic Graphite (DC-HOPG) x-ray spectrometer was developed to study laser-generated electron beam transport. The instrument uses a pair of graphite crystals and has the advantage of simultaneously detecting self emission from low-Z materials in first diffraction order and high-Z materials in second order. The emissions from the target are detected using a pair of parallel imaging plates positioned in a such way that the noise from background is minimized and the mosaic focusing is achieved. Initial tests of the diagnostic on Titan laser (I {approx} 10{sup 20} W/cm{sup 2}, {tau} = 0.7 ps) show excellent signal-to-noise ratio (SNR) > 1000 for the low energy channel and SNR > 400 for the high energy channel.

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We present a search for semileptonic B decays to the charmed baryon {Lambda}{sub c}{sup +} based on 420 fb{sup -1} of data collected at the {Upsilon}(4S) resonance with the BABAR detector at the PEP-II e{sup +}e{sup -} storage rings. By fully reconstructing the recoiling B in a hadronic decay mode, we reduce non-B backgrounds and determine the flavor of the signal B. We statistically correct the flavor for the effect of the B{sup 0} mixing. We obtain a 90% confidence level upper limit of {Beta}({bar B} {yields} {Lambda}{sub c}{sup +} X{ell}{sup -} {bar {nu}}{sub {ell}})/{Beta}({bar B} {yields} {Lambda}{sub c}{sup +} X) < 3.5%.