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Reflection from Si3N4
Photograph of a reflection from Si3N4 (silicon nitride) taken under a focused ion beam (FIB) microscope.
Date:
November 9, 2005
Creator:
University of North Texas. Center for Media Production.
System:
The UNT Digital Library
[Tracey takes photograph in CMP studio]
Photograph of Center for Media Production (CMP) staff member Tracey taking a photograph in a studio on the UNT campus. Tracey is facing to the left, looking into the viewfinder of a camera. She is adjusting the focus of the camera with her left hand. A portrait backdrop and a lighting umbrella can be seen in the background of the photograph.
Date:
June 9, 2000
Creator:
University of North Texas. Center for Media Production.
System:
The UNT Digital Library
Surface
Photograph of a scan taken by a focused ion beam (FIB) microscope. The scan shows a large group of thin, elongated forms connected to an irregular surface.
Date:
November 9, 2005
Creator:
University of North Texas. Center for Media Production.
System:
The UNT Digital Library