Several studies have suggested that the uniformity of Cadmium Zinc Telluride (CZT) detectors play an important role in their performance when operated as gamma-ray spectrometers. However the detailed gamma response of simple planar detectors as a function of position over the device area is largely unknown. To address this issue the authors have built a system capable of measuring the detector response with a resolution of {approximately}250 {micro}m. The system consists of a highly collimated ({approximately}200 {micro}m) photon source (<150 kev) scanned over the detector using a computer controlled two-axis translation stage. Fifteen samples configured as planar detectors were examined with the new apparatus. The material grade of the detectors examined varied from counter to select discriminator. Two classes of spatial response variation were observed and are presented here. Infrared (IR) transmission images were also acquired for each sample and correlation between features in the pulse height spectrum and crystalline defects were observed.

Resistivity results from a 48x48 pixelated CdZnTe (CZT) radiation detector array are presented alongside X-ray topography and detector mapping with a collimated gamma-ray beam. By using a variety of measurements performed on the same sample and registering each data set relative to the others, the spatial dependence of relationships between them was examined. The local correlations between resistivity and one measure of detector performance were strongly influenced by the positions of grain boundaries and other gross crystal defects in the sample. These measurements highlight the need for material studies of spatially heterogeneous CZT to record position information along with the parameters under study.