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Time-resolved imaging of current-induced domain-wall oscillations (open access)

Time-resolved imaging of current-induced domain-wall oscillations

Current-induced domain-wall dynamics is investigated via high-resolution soft x-ray transmission microscopy by a stroboscopic pump-and-probe measurement scheme at a temporal resolution of 200 ps. A 180{sup o} domain wall in a restoring potential of a permalloy microstructure is displaced from its equilibrium position by nanosecond current pulses leading to oscillations with velocities up to 325 m/s. The motion of the wall is described with an analytical model of a rigid domain wall in a nonharmonic potential allowing one to determine the mass of the domain wall. We show that Oersted fields dominate the domain-wall dynamics in our geometry.
Date: October 7, 2008
Creator: Bocklage, Lars; Krueger, Benjamin; Eiselt, Rene; Bolte, Markus; Fischer, Peter & Meier, Guido
System: The UNT Digital Library
AFM CHARACTERIZATION OF RAMAN LASER INDUCED DAMAGE ON CDZNTECRYSTAL SURFACES (open access)

AFM CHARACTERIZATION OF RAMAN LASER INDUCED DAMAGE ON CDZNTECRYSTAL SURFACES

High quality CdZnTe (or CZT) crystals have the potential for use in room temperature gamma-ray and X-ray spectrometers. Over the last decade, the methods for growing high quality CZT have improved the quality of the produced crystals however there are material features that can influence the performance of these materials as radiation detectors. The presence of structural heterogeneities within the crystals, such as twinning, pipes, grain boundaries (polycrystallinity), and secondary phases (SPs) can have an impact on the detector performance. There is considerable need for reliable and reproducible characterization methods for the measurement of crystal quality. With improvements in material characterization and synthesis, these crystals may become suitable for widespread use in gamma radiation detection. Characterization techniques currently utilized to test for quality and/or to predict performance of the crystal as a gamma-ray detector include infrared (IR) transmission imaging, synchrotron X-ray topography, photoluminescence spectroscopy, transmission electron microscopy (TEM), atomic force microscopy (AFM) and Raman spectroscopy. In some cases, damage caused by characterization methods can have deleterious effects on the crystal performance. The availability of non-destructive analysis techniques is essential to validate a crystal's quality and its ability to be used for either qualitative or quantitative gamma-ray or X-ray detection. The …
Date: October 7, 2008
Creator: Teague, L. & Duff, M.
System: The UNT Digital Library