Federal Register, Volume 74, Number 34, February 23, 2009, Pages 7993-8138 (open access)

Federal Register, Volume 74, Number 34, February 23, 2009, Pages 7993-8138

Daily publication of the U.S. Office of the Federal Register contains rules and regulations, proposed legislation and rule changes, and other notices, including "Presidential proclamations and Executive Orders, Federal agency documents having general applicability and legal effect, documents required to be published by act of Congress, and other Federal agency documents of public interest" (p. ii). Table of Contents starts on page iii.
Date: February 23, 2009
Creator: United States. Office of the Federal Register.
Object Type: Journal/Magazine/Newsletter
System: The UNT Digital Library
Out-of-band exposure characterization with the SEMATECH Berkeley 0.3-NA microfield exposure tool (open access)

Out-of-band exposure characterization with the SEMATECH Berkeley 0.3-NA microfield exposure tool

For the commercialization of extreme ultraviolet lithography (EUVL), discharge or laser produced, pulsed plasma light sources are being considered. These sources are known to emit into a broad range of wavelengths that are collectively referred to as the out-of-band (OOB) radiation by lithographers. Multilayer EUV optics reflect OOB radiation emitted by the EUV sources onto the wafer plane resulting in unwanted background exposure of the resist (flare) and reduced image contrast. The reflectivity of multilayer optics at the target wavelength of 13.5 nm is comparable to that of their reflectivity in the deep ultraviolet (DUV) and UV regions from 100-350 nm. The aromatic molecular backbones of many of the resists used for EUV are equally absorptive at specific DUV wavelengths as well. In order to study the effect of these wavelengths on imaging performance in a real system, we are in the process of integrating a DUV source into the SEMATECH Berkeley 0.3-NA Microfield Exposure Tool (MET). The MET plays an active role in advanced research in resist and mask development for EUVL and as such, we will utilize this system to systematically evaluate the imaging impact of DUV wavelengths in a EUV system. In this paper, we present the …
Date: February 23, 2009
Creator: George, Simi A.; Nauleau, Patrick; Rekawa, Senajith; Gullikson, Eric & Kemp, Charles D.
Object Type: Article
System: The UNT Digital Library
End-of-Life Care: Services, Costs, Ethics, and Quality of Care (open access)

End-of-Life Care: Services, Costs, Ethics, and Quality of Care

This report provides information on various aspects of end-of-life care: (1) demographic and historical changes affecting death and dying in the United States (2) the definitions of end-of-life, palliative, and hospice care (3) costs associated with end-of-life care (4) end-of-life care laws and ethics (5) quality of care at the end of life and (6) policy issues that would modify or expand the federal government's role in addressing end-of-life care.
Date: February 23, 2009
Creator: Colello, Kirsten J.; Mulvey, Janemarie; Sarata, Amanda K.; Williams, Erin D. & Thomas, Kenneth R.
Object Type: Report
System: The UNT Digital Library