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Advancements in one-dimensional profiling with a long trace profiler
Over the last several years the long trace profiler (LTP) has been evolving into a sophisticated machine capable of measuring surface profiles of very long dimensions. This report explains improvements, both hardware and software, that have helped to achieve accuracies and ranges in surface profiling that have been unobtainable until now. A comparison made by measuring standard optical surfaces on other instruments corroborates these accuracies.
Date:
June 1, 1992
Creator:
Irick, S.C. & McKinney, W.R.
System:
The UNT Digital Library
Advancements in one-dimensional profiling with a long trace profiler
Over the last several years the long trace profiler (LTP) has been evolving into a sophisticated machine capable of measuring surface profiles of very long dimensions. This report explains improvements, both hardware and software, that have helped to achieve accuracies and ranges in surface profiling that have been unobtainable until now. A comparison made by measuring standard optical surfaces on other instruments corroborates these accuracies.
Date:
June 1, 1992
Creator:
Irick, S. C. & McKinney, W. R.
System:
The UNT Digital Library